ID Number: G00167884




Market Share: Semiconductor Process Control Equipment, Worldwide, 2008
5 May 2009
 
Mark Stromberg   Bob Johnson   Takashi Ogawa   Klaus Rinnen  

In 2008, the semiconductor process control equipment market declined 32%. This followed growth of slightly less than 8% in 2007.







Price: US$6,995.00

Pages: 29








Browse Topics


Other Options







Contact Gartner





Purchasing this document is fast, easy and secure, but you must be registered with gartner.com so we can track your order. Please select your status from these three choices:
Registration is required to purchase this document.
Or, you can register for gartner.com only.
You or your organization may already own this document. Register now to find out. Your Gartner Membership Administrator can supply the needed License Key(s).
You will not lose your document during registration.

Sign in here:
Username:

Password:
Forgot your username
or password?







For more information about purchasing this or other documents, contact Gartner at one of the telephone numbers below:
North America:    +1 203-316-3010 7:30 am - 8:00 pm Stamford, CT
Europe:    +44 1784 267770 9:00 am - 5:00 pm London
Asia/Pacific:    +65 6879 2785 9:00 am - 6:00 pm Singapore
Japan:    +81 3 3481 3552 9:00 am - 5:30 pm Tokyo




Table of Contents



This report provides market size and market share ranking for the semiconductor process control equipment market. The report generator allows the creation and customization of tables that provide 10-year historical data and regional market size. The following regions are covered in this report: Worldwide; the Americas; Japan; South Korea; Taiwan; China; Other Asia/Pacific; and Europe, the Middle East and Africa.

Process Control

Lithography Metrology

Mask Inspection and Review

Mask Metrology

Overlay Metrology

CD Measurement

CD-SEM

Optical CD Measurement

Wafer Inspection and Defect Review

Patterned Wafer Inspection

E-Beam Patterned Wafer Inspection

Optical Patterned Wafer Inspection

Defect Review and Classification

SEM Defect Review and Classification

Optical Defect Review and Classification

Other Defect Review and Classification

Macro Defect Detection

Unpatterned Wafer Inspection

Thin-Film Metrology

Nonmetal Thin-Film Metrology

Nonmetal Thin-Film Metrology (Integrated)

Nonmetal Thin Film Metrology (Stand-Alone)

Other Thin-Film/Substrate Metrology

Other Process Control Systems

Process Control Software

Other Process Control






Browse Topics:
 





This document is published in the following Dataquest Market Insights:
 
Semiconductor and Electronic Manufacturing Worldwide





© 2009 Gartner, Inc. and/or its Affiliates. All Rights Reserved. Reproduction and distribution of this publication in any form without prior written permission is forbidden. The information contained herein has been obtained from sources believed to be reliable. Gartner disclaims all warranties as to the accuracy, completeness or adequacy of such information. Although Gartner's research may discuss legal issues related to the information technology business, Gartner does not provide legal advice or services and its research should not be construed or used as such. Gartner shall have no liability for errors, omissions or inadequacies in the information contained herein or for interpretations thereof. The opinions expressed herein are subject to change without notice.




Resource Id: 965814